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Poster - 25 Electron: Electron crystallography
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Presentations | |
ID: 1952
/ Poster - 25 Electron: 1
Poster session abstracts Poster Poster session abstracts ID: 810
/ Poster - 25 Electron: 2
Methods and instruments Oral/poster MS: Recent advances in electron crystallography techniques Keywords: electron crystallography, beam sensitive materials, structure solution, structure refinement, MOF Dynamical refinement of beam sensitive crystals: going below a total dose of 0.1 e-/Ų Institut Néel, Grenoble, France External Resource: https://www.xray.cz/iucrp/P_371
ID: 828
/ Poster - 25 Electron: 3
All topics Oral/poster MS: Nanocrystalline materials, Crystal chemistry with emerging technology, Recent advances in electron crystallography techniques Keywords: electron diffractometer, electron diffraction, electron crystallography, nanocrystallography An electron diffractometer : A novel device for electron crystallography experiments ELDICO Scientific AG, 5234 Villigen, Switzerland External Resource: https://www.xray.cz/iucrp/P_379
ID: 1118
/ Poster - 25 Electron: 4
Methods and instruments Oral/poster MS: Recent advances in electron crystallography techniques, Recent advances in instrumentation Keywords: Electron Diffraction, Electron Crystallography, Instrumentation Synergy ED: A new electron diffractometer for microED 1Rigaku Corporation, Haijima, Tokyo, Japan; 2Rigaku Americas Corporation, The Woodlands, Texas, USA; 3Rigaku Polska, Wrocław, Poland; 4JEOL Ltd., Akishima, Tokyo, Japan External Resource: https://www.xray.cz/iucrp/P_370
ID: 599
/ Poster - 25 Electron: 5
Methods and instruments Oral/poster MS: Recent advances in electron crystallography techniques Keywords: electron-diffractometer, electron-diffraction, nano-crystallography, nano-diffraction, 3D-ED The ´Why´ and ´How´ of a Dedicated Electron Diffractometer ELDICO Scientific AG, 5234 Villigen, Switzerland External Resource: https://www.xray.cz/iucrp/P_372
ID: 1055
/ Poster - 25 Electron: 6
All topics Oral/poster MS: Combination of X-ray and electrons for structure characterization Keywords: Structure determination, Transition metal phosphates, Proton conductivity, In situ investigations Ab initio structure determination of two new titanium phosphates synthesized via molten salt synthesis. 1Max-Planck-Institut für Kohlenforschung, Heterogeneous Catalysis, Kaiser-Wilhelm-Platz 1 45470 Mülheim, Germany; 2Crystallography/Geosciences, University of Bremen, Klagenfurter Straße 28359 Bremen, Germany; 3MAPEX Center for Materials and Processes, University of Bremen, 28334 Bremen, Germany; 4Deutsches Elektronen-Synchrotron (DESY), Notkestraße 85 22607 Hamburg, Germany External Resource: https://www.xray.cz/iucrp/P_376
ID: 1615
/ Poster - 25 Electron: 7
All topics Poster MS: Solid state reactions and dynamics, Combination of X-ray and electrons for structure characterization, Energy Materials Posters only: Materials and minerals (if it does not fit to any specific topics) Keywords: superconductor; MgB2; microstructure; Rietveld. Effect of nano-SiC doping on the structure and superconducting properties of Mg (B1-xCx) 2 1Instituto de Nanociencia y Nanotecnología, CNEA-CONICET, Av. Bustillo 9500 Bariloche, Argentina; 2Instituto Balseiro, Universidad Nacional de Cuyo, Av. Bustillo 9500 Bariloche, Argentina; 3Institut für Werkstofftechnik, Universität Kassel, 34125 Kassel, Germany; 4Comisión Nacional de Energía Atómica, Av. Bustillo 9500 Bariloche, Argentina External Resource: https://www.xray.cz/iucrp/P_375
ID: 1400
/ Poster - 25 Electron: 8
Methods and instruments Poster MS: In-situ and time resolved electron crystallography, Application of electron crystallography to functional materials Keywords: TEM, in situ, 3DED, LSMO, Ruddlesden-Popper manganites Investigating structure transformations of LaxSr2-xMnO4-δ using in situ 3D electron diffraction in a gas environment 1EMAT, University of Antwerp, Groenenborgerlaan 171, B-2020 Antwerp, Belgium External Resource: https://www.xray.cz/iucrp/P_368
ID: 1161
/ Poster - 25 Electron: 9
Methods and instruments Oral/poster MS: Recent advances in electron crystallography techniques Keywords: 4D-STEM; nanoparticle; quantitative STEM Investigating nanoparticle surface energetics using 4D-STEM 1Monash Centre for Electron Microscopy, Monash University, VIC, 3800, Australia; 2Department of Materials Engineering, Monash University, VIC, 3800, Australia; 3School of Chemistry, Monash University, VIC, 3800, Australia External Resource: https://www.xray.cz/iucrp/P_367
ID: 1440
/ Poster - 25 Electron: 10
Poster sessions Poster Posters only: Macromolecular and biological crystallography (if it does not fit to any specific topics), Theory, computation, modeling, data, standards (if it does not fit to any specific topics) Keywords: electron-diffraction, organic molecules, multislice Simulation of electron diffraction patterns of organic crystals under continuous rotation STFC, London, United Kingdom External Resource: https://www.xray.cz/iucrp/P_380
ID: 1618
/ Poster - 25 Electron: 11
Poster sessions Poster Posters only: Electron crystallography Keywords: electron diffraction, TEM, protein ED The perks of a Zeiss Libra 120 plus TEM - First steps towards electron diffraction 1University of Graz, Graz, Austria; 2Stockholm University, Stockholm, Sweden External Resource: https://www.xray.cz/iucrp/P_373
ID: 1680
/ Poster - 25 Electron: 12
Poster sessions Poster Posters only: Electron crystallography Keywords: Electron diffraction, machine learning, dynamical diffraction, LACBED Machine Learning Calculation of Large Angle Convergent Beam Electron Diffraction Patterns University of Warwick, Coventry, United Kingdom External Resource: https://www.xray.cz/iucrp/P_377
ID: 1890
/ Poster - 25 Electron: 13
Theory, computation, modelling, data, standards Poster Posters only: Theory, computation, modeling, data, standards (if it does not fit to any specific topics) Keywords: electron diffraction, IAM, TAAM, MoPro, quantum crystallography Refinement on electron diffraction data in MoPro: A quest for improved structure model 1University of Warsaw, Warsaw, Poland; 2Université; de Lorraine, CNRS, CRM2, Nancy, France External Resource: https://www.xray.cz/iucrp/P_374
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