Session | ||
MS-56: Analysis of the fine structure in electron diffraction data
Invited: Paul Voyles (USA), Cheuk-Wai Tai (Sweden) | ||
Session Abstract | ||
In a disordered or amorphous material, the atomic arrangement does not follow a strict lattice rule; therefore, it is in principle impossible to know exact atomic composition at a specified point. Application of Pair Distribution Function (PDF) on electron diffraction data provides viable tool for study the structure of such materials. Especial importance of this method is its applicability to study local disorder and nanomaterials. For all abstracts of the session as prepared for Acta Crystallographica see PDF in Introduction, or individual abstracts below. | ||
Introduction | ||
Presentations | ||
2:45pm - 2:50pm
Introduction to session 2:50pm - 3:20pm
Approximate Rotational Symmetries in Electron Nanodiffraction from Amorphous Materials University of Wisconsin-Madison, Madison, United States of America External Resource: https://www.xray.cz/iucrv/vidp.asp?id=390
3:20pm - 3:50pm
Local structure analysis by pair distribution function obtained from a TEM Stockholm University, Stockholm, Sweden External Resource: https://www.xray.cz/iucrv/vidp.asp?id=391
3:50pm - 4:10pm
Quantitative analysis of diffuse electron scattering in the lithium-ion battery cathode material Li1.2Ni0.13Mn0.54Co0.13O2 1University of Antwerp, Department of Physics, Electron Microscopy for Materials Science (EMAT), Groenenborgerlaan 171, B-2020 Antwerp, Belgium; 2Friedrich-Alexander-Universität Erlangen-Nürnberg, Department of Physics, Institute of Condensed Matter Physics, Schloßplatz 4, 91054 Erlangen, Germany External Resource: https://www.xray.cz/iucrv/vidp.asp?id=392
4:10pm - 4:30pm
High-Throughput Electron Diffraction Reveals a Hidden Novel Metal-Organic Framework Stockholm University, Stockholm, Sweden External Resource: https://www.xray.cz/iucrv/vidp.asp?id=393
4:30pm - 4:50pm
Scanning Nano-Structure Electron Microscopy - Hidden Potential for Evolving Systems 1Department of Applied Physics and Applied Mathematics, Columbia University, New York, NY, USA; 2Department of Materials Science and Engineering, Johns Hopkins University, Baltimore, MD, USA; 3NanoMEGAS SPRL, Belgium; 4Department of Materials Science and Engineering, University of California Riverside, Riverside, CA, USA; 5Condensed Matter Physics and Materials Science Department, Brookhaven National Laboratory, Upton, NY, USA External Resource: https://www.xray.cz/iucrv/vidp.asp?id=394
4:50pm - 5:10pm
Information theory based plane symmetry classifications: revealing pseudo-symmetries in the presence of noise Portland State University, PORTLAND, Oregon, USA External Resource: https://www.xray.cz/iucrv/vidp.asp?id=395
|