Conference Agenda

Session
Poster - 15 Films: Crystallographic analysis of thin films and surfaces
Time:
Monday, 16/Aug/2021:
5:10pm - 6:10pm

Session Chair: Milan Dopita

 


Presentations

Poster session abstracts

Radomír Kužel



Investigating the crystallization behavior of Ge-rich GST PCMs with in-situ synchrotron XRD

Philipp Hans1, Christophe Guichet1, Cristian Mocuta2, Marie Ingrid Richard1,3, Daniel Benoit4, Philippe Boivin5, Yannick Le-Friec4, Roberto Simola5, Olivier Thomas1

1Aix-Marseille Université, CNRS, IM2NP UMR 7334, Marseille, France; 2Synchrotron SOLEIL, Saint-Aubin, France; 3ID01/ESRF, The European Synchrotron, 71 rue des Martyrs, 38043 Grenoble, France; 4STMicroelectronics, 850 rue Jean Monnet, 38920 Crolles, France; 5STMicroelectronics, 190 Ave Coq, 13106 Rousset, France



Self-consistent diffraction stress analysis for estimating stress and composition of alloy films

Takashi Harumoto, Ji Shi, Yoshio Nakamura

Tokyo Institute of Technology, Tokyo, Japan



Twin domains of ScN (001) films on MgO (001)

Esther de Prado, Joris More-Chevalier, Stanislav Cichoň, Ján Lančok

Institute of Physics of the Czech Academy of Sciences, Prague, Czech Republic



Phase formations in tungsten carbide films deposited by reactive magnetron sputtering

Lea Haus1,2, Martin Thümmler1, Julia Wöckel2, Christina Wüstefeld1, Matthias Müller2, David Rafaja1

1Institute of Materials Science, TU Bergakademie Freiberg, Freiberg, Germany; 2Plasma Technology, Robert Bosch Manufacturing Solutions GmbH, 70442 Stuttgart, Germany



Laboratory and synchrotron rocking curve imaging for crystal lattice misorientation mapping

Petr Mikulík, Ondřej Caha, Mojmír Meduňa

Masaryk University, Brno, Czech Republic



Titanium surface modified by nitrogen ion implantation

Jan Drahokoupil1, Petr Vlčák2, Miroslav Lebeda1,2

1Institute of Physics, AS CR, Na Slovance 2, 182 21 Prague, Czech Republic; 2Faculty of Mechanical Engineering, Czech Technical University in Prague, Technicka 4, 16607 Prague, Czech Republic



Ion implantation into ZrNb nanometric multilayers

Miroslav Karlík1,2, Nabil Daghbouj3, Jan Lorinčík4, Tomáš Polcar3, Mauro Callisti5, Vladimír Havránek6

1Charles University, Faculty of Mathematics and Physics, Praha 2, Czech Republic; 2Czech Technical University in Prague, Department of Materials, Praha 2, Czech Republic; 3Czech Technical University in Prague, Department of Control Engineering, Praha 6, Czech Republicc; 4Research Centre Řež, Husinec-Řež, Czech Republic; 5Department of Materials Science and Metallurgy, University of Cambridge, UK; 6Nuclear Physics Institute CAS, 250 68 Řež, Czech Republic