Session | ||
MS-7: High troughput vs. careful planning: How to get the best data?
Invited: Danny Axford (UK), Aina Cohen (USA) | ||
Session Abstract | ||
The experimental data (diffraction intensities, EM images, etc.) are obviously the primary source for all subsequent elucidation of macromolecular structures. The highest possible quality of these data is therefore of crucial importance. Many user-friendly and automatic programs are available for measuring and quality-estimation of data obtained by various techniques, but it is sometimes not clear which factors play most important roles for the veracity and accuracy of the final structural For all abstracts of the session as prepared for Acta Crystallographica see PDF in Introduction, or individual abstracts below. | ||
Introduction | ||
Presentations | ||
10:20am - 10:25am
Introduction to session 10:25am - 10:55am
Next-generation Automation and Remote-access Crystallography Stanford Synchrotron Radiation Lightsource (SSRL) and Linac Coherent Light Source (LCLS), SLAC National Accelerator Laboratory, Stanford University, Menlo Park, United States of America External Resource: https://www.xray.cz/iucrv/vidp.asp?id=484
10:55am - 11:25am
Strength in Numbers: Exploiting the space between single crystal oscillation and serial femtosecond crystallography Diamond Light Source, Harwell Oxford, Didcot, OX11 0DE, United Kingdom External Resource: https://www.xray.cz/iucrv/vidp.asp?id=485
11:25am - 11:45am
Towards High-Throughput Autonomous Infrared Spectromicroscopy LBNL, Berkeley, United States of America External Resource: https://www.xray.cz/iucrv/vidp.asp?id=486
11:45am - 12:05pm
Strategy in the age of 360° sweeps DECTRIS, Baden-Dättwil, Switzerland External Resource: https://www.xray.cz/iucrv/vidp.asp?id=487
12:05pm - 12:25pm
Exploring the mechanism of elastically flexible crystals by automatic analysis 1The University of Queensland, St Lucia, QLD, Australia; 2The Australian Synchrotron, Clayton, VIC, Australia External Resource: https://www.xray.cz/iucrv/vidp.asp?id=488
Finding the optimal resolution cutoff with PAIREF 1Czech Technical University in Prague, Czech Republic, Faculty of Nuclear Sciences and Physical Engineering; 2Institute of Biotechnology of the Czech Academy of Sciences, Biocev; 3University of Konstanz; 4University of Chemical and Technology Prague, Department of Biochemistry and Microbiology External Resource: https://www.xray.cz/iucrv/vidp.asp?id=489
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