Overview and details of the sessions of this conference. Please select a date or location to show only sessions at that day or location. Please select a single session for detailed view (with abstracts and downloads if available).
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Session Overview |
Session | ||
MS-40: New applications of coherent scattering
Invited: Johanned Ihli (Switzerland), Foivos Perakis (Sweden) | ||
Session Abstract | ||
This should have a real new life by the fact that the 4th gen synchrotrons will boost their coherence volume. Plus new techniques and also progress with XPCS at XFELs provides new insight: XCCA, XPCS and its variants, applications to new systems For all abstracts of the session as prepared for Acta Crystallographica see PDF in Introduction, or individual abstracts below. | ||
Introduction | ||
Presentations | ||
10:20am - 10:25am
Introduction to session 11:45am - 12:05pm
Burning cups and donuts: what coherent X-rays can reveal about topological defects 1European Synchrotron Radiation Facility, 71 Avenue des Martyrs, 38000 Grenoble, France; 2Tohoku University, Laboratory for Nanoelectronics and Spintronics, Sendai 980-8577, Japan; 3Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, NY 12180 Troy, USA |