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KN-36: Metadata and checkCIF for raw diffraction data in realising ultimate crystallographic objectivity
Loes Kroon-Batenburg | ||
Presentations | ||
ID: 1569
/ KN-36: 1
Plenary and keynote Invited lecture to session Keywords: raw diffraction data, metadata, FAIR Metadata and checkCIF for raw diffraction data and their role in realising crystallographic science objectivity Utrecht University, Utrecht, The Netherlands External Resource: https://www.xray.cz/iucrv/vidp.asp?id=29
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