Session | ||
MS-80: 4th generation SR and XFEL Facilities
Invited: Jean Susini (France) | ||
Session Abstract | ||
Recent advance of accelerator technologies has promoted the emergence of ultrabrilliant, coherent x-ray sources such as 4th generation synchrotron light sources and X-ray free-electron lasers (XFELs). The former renovates a vast range of scientific applications with an ultralow-emittance storage-ring source, while the latter enables ultimate “snapshot” observation using intense, femtosecond X-ray pulses. This microsymposium will focus on new scientific opportunities and perspectives enabled with these novel sources. It also covers advanced applications of X-ray absorption spectroscopy (XAS) achieved with the new sources. | ||
Introduction | ||
Presentations | ||
10:20am - 10:25am
Introduction to session 10:25am - 10:55am
The ultra-low emittance synchrotron storage rings: a new paradigm for matter characterization. Synchrotron SOLEIL, Gif sur Yvette, France External Resource: https://www.xray.cz/iucrv/vidp.asp?id=559
10:55am - 11:15am
Ultrafast structural changes in matter induced by intense X-ray free-electron laser pulses 1RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo, Hyogo 679-5148, Japan.; 2Japan Synchrotron Radiation Research Institute, Kouto 1-1-1, Sayo, Hyogo 679-5198, Japan; 3University of Tsukuba, Tsukuba, Ibaraki 305-8571, Japan. External Resource: https://www.xray.cz/iucrv/vidp.asp?id=560
11:15am - 11:35am
Pink-beam serial femtosecond crystallography for accurate structure factor determination at an X-ray free electron laser 1Paul Scherrer Institut, Forschungstrasse 111, Villigen, 5232, Switzerland; 2Center for Free-Electron Laser Science, Notkestrasse 85, Hamburg, 22607, Germany External Resource: https://www.xray.cz/iucrv/vidp.asp?id=561
11:35am - 11:55am
Towards a structural biology at organism relevant temperature and chemical conditions University of Manchester, Manchester, United Kingdom External Resource: https://www.xray.cz/iucrv/vidp.asp?id=562
11:55am - 12:15pm
Ultrafast dynamical diffraction wavefronts in strained Si imagined with Tele-ptychography 1Eu XFEL GmbH, Schenefeld, Germany; 2Paul Scherrer Institute, Villigen PSI, Switzerland; 3Chalmers University of Technology, Gothenburg, Sweden; 4MAX IV, Lund University, Lund, Sweden External Resource: https://www.xray.cz/iucrv/vidp.asp?id=563
Advances with EIGER2 (CdTe) detectors for Synchrotron and Laboratory Dectris Ltd, Baden-Daettwil , Switzerland External Resource: https://www.xray.cz/iucrv/vidp.asp?id=877
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