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Poster - 22 Ptychography: Ptychography, imaging, coherent scattering
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Presentations | |
ID: 1949
/ Poster - 22 Ptychography: 1
Poster session abstracts Poster Poster session abstracts ID: 1061
/ Poster - 22 Ptychography: 2
Methods and instruments Poster MS: Ptychography: present and near future Posters only: Methods, instrumentation (if it does not fit to any specific topics) Keywords: ptychographic x-ray computed tomography; x-ray fluorescence tomography; scattering; spectroscopy Ptychographically-assisted X-ray fluorescence nanotomography for characterization of complex materials 1European Synchrotron Radiation Facility, 71 Avenue des Martyrs, Grenoble, France; 2Paul Scherrer Institut, Forschungsstrasse 111, Villigen, Switzerland External Resource: https://www.xray.cz/iucrp/P_342
ID: 1063
/ Poster - 22 Ptychography: 3
Methods and instruments Poster MS: Ptychography: present and near future Posters only: Methods, instrumentation (if it does not fit to any specific topics) Keywords: x-ray holographic nano-tomography; ptychographic x-ray computed tomography; x-ray fluorescence tomography Coherent X-ray imaging at ID16A: status and plans 1European Synchrotron Radiation Facility, 71 Avenue des Martyrs, Grenoble, France; 2Inserm UA7 STROBE, Universite Grenoble Alpes, 71 Avenue des Martyrs, Grenoble, France External Resource: https://www.xray.cz/iucrp/P_343
ID: 1111
/ Poster - 22 Ptychography: 4
Methods and instruments Oral/poster MS: Ptychography: present and near future Keywords: Dynamic; spatiotemporal constraint; coherent diffractive imaging; nanoparticle, ptychography; Toward dynamic ptychography using a spatiotemporal overlap constraint 1La Trobe University, Melbourne, Australia; 2ANSTO Australian Synchrotron, Claytion, Australia External Resource: https://www.xray.cz/iucrp/P_344
ID: 1112
/ Poster - 22 Ptychography: 5
Methods and instruments Oral/poster MS: New applications of coherent scattering Keywords: Keywords: Coherent diffraction imaging; Calcium carbonate; 3D morphology Coherent X-ray diffraction imaging to investigate structure and morphological evolution of calcium carbonate microparticles 1PoreLab, Department of Physics, Norwegian University of Science and Technology (NTNU), Høgskoleringen 5, 7491 Trondheim, Norway; 2Department of Chemical Engineering, Norwegian University of Science and Technology, Trondheim, Norway; 3ESRF, The European Synchrotron, Grenoble, France; 4LUNAM, IMMM, UMR 6283 CNRS, Faculté des Sciences, Le Mans Université, 72085 Le Mans, France External Resource: https://www.xray.cz/iucrp/P_341
ID: 1117
/ Poster - 22 Ptychography: 6
Methods and instruments Oral/poster MS: Ptychography: present and near future, New applications of coherent scattering, 4th generation SR and XFEL Facilities Keywords: Single-shot, Holography, Ptychography, Near-field imaging, X-ray optics Super-resolution X-ray holography Georg-August-Universitaet Goettingen, Goettingen, Germany External Resource: https://www.xray.cz/iucrp/P_346
ID: 1219
/ Poster - 22 Ptychography: 7
All topics Oral/poster MS: Texture, strain and structure in metals and ceramics, Diffraction imaging, grain mapping in materials and art Keywords: materials science, diffraction, gypsum, grains Diffraction imaging and tomography investigations on the hydration of gypsum plaster 1European Synchrotron Radiation Facility, 71 Avenue Des Martyrs, 38040 Grenoble , France; 2Institut de science de la Terre, Université Grenoble Alpes, 1381 Rue de la Piscine, 38610 Gières, France External Resource: https://www.xray.cz/iucrp/P_347
ID: 920
/ Poster - 22 Ptychography: 8
All topics Oral/poster MS: New applications of coherent scattering Keywords: coherent scattering, XPCS, GISAXS, GTSAXS, DWBA Grazing-incidence small angle X-ray photoncorrelation spectroscopy: limitations and opportunities 1Herzig Group - Structure Formation & Dynamics, University Bayreuth, Bayreuth, Germany; 2Center for Advanced Mathematics for Energy Research Applications (CAMERA), Lawrence Berkeley National Laboratory, USA; 33National Synchrotron Light Source II, Brookhaven National Laboratory, USA External Resource: https://www.xray.cz/iucrp/P_345
ID: 1466
/ Poster - 22 Ptychography: 9
Methods and instruments Poster MS: New applications of coherent scattering Keywords: Bragg coherent diffraction imaging; coherent diffraction imaging Development and improvement of Bragg coherent diffraction imaging for expanding observable particle-size range 1Synchrotron Radiation Research Center, Kansai Photon Science Institute, Quantum Beam Science Research Directorate, National Institutes for Quantum and Radiological Science and Technology (QST), SPring-8, 1-1-1 Kouto, Sayo, Hyogo 679-5148, Japan; 2Japan Synchrotron Radiation Research Institute, Kouto 1-1-1, Sayo-cho, Sayo-gun, Hyogo 679-5198, Japan; 3Graduate School of Advanced Science and Engineering, Hiroshima University, Higashihiroshima, Hiroshima, 739-8526, Japan External Resource: https://www.xray.cz/iucrp/P_348
ID: 1468
/ Poster - 22 Ptychography: 10
All topics Oral/poster MS: New applications of coherent scattering, 4th generation SR and XFEL Facilities Posters only: Macromolecular and biological crystallography (if it does not fit to any specific topics), Physical and fundamental crystallography (if it does not fit to any specific topics), Methods, instrumentation (if it does not fit to any specific topics), General (if it does not fit to any specific topics nor areas) Keywords: Single Particle Imaging, X-ray Free Electron Lasers, Wavefront Characterisation, Phase-Retrieval Wavefield Characterisation of MHz XFEL Pulses 1La Trobe Institute for Molecular Sciences, La Trobe University, Victoria 3086, Australia.; 2European XFEL GmbH, Albert-Einstein-Ring 19, 22761 Hamburg, Germany; 3School of Physics, Monash University, Victoria 3800, Australia External Resource: https://www.xray.cz/iucrp/P_350
ID: 1511
/ Poster - 22 Ptychography: 11
Methods and instruments Poster MS: Ptychography: present and near future Posters only: Methods, instrumentation (if it does not fit to any specific topics) Keywords: ptychography, a priori information, phase-retrieval algorithm, total variation, EUV mask inspection Ptychographic image reconstruction using total variation regularization Paul Scherrer Institut, Villigen PSI, Switzerland External Resource: https://www.xray.cz/iucrp/P_349
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