Session | ||
MS-37: Total scattering
Invited: Stephan Rosenkranz (USA), Bo Brummerstedt Iversen (Denmark) | ||
Session Abstract | ||
Analysis of diffuse scattering on a par with Bragg scattering, popularly known as total scattering approach, utilizing X-ray, neutron and electron diffraction, is instrumental in characterizing the local and intermediate range structure of complex functional materials. As such, it is applicable to a diverse class of problems in contemporary material science, solid state chemistry and condensed matter physics. Advanced instrumentation in synergy with large scale computational tools unlock unprecedented insights into the world of materials and devices fostering their thorough understanding and optimization. With the development of experimental tools more advanced total scattering based techniques are emerging, such as time resolved, dynamic, magnetic, computed tomography, thin film and surface pair distribution function (PDF) approaches, as well as 3D-dPDF utilizing single crystal diffraction to map out in detail the reciprocal space. This microsymposium aims at the cross-section of state-of-the-art of total scattering and associated achievements on the complex materials frontier. For all abstracts of the session as prepared for Acta Crystallographica see PDF in Introduction, or individual abstracts below. | ||
Introduction | ||
Presentations | ||
10:20am - 10:25am
Introduction to session 10:25am - 10:55am
Pair Distribution Function Analysis in Materials Science Aarhus University, Aarhus, Denmark External Resource: https://www.xray.cz/iucrv/vidp.asp?id=278
10:55am - 11:25am
Recent developments in measuring and analysing large 3D volumes of scattering data to investigate the role of complex disorder on crystalline materials properties Materials Science Division, Argonne National Laboratory, Lemont, Illinois 60439, United States of America External Resource: https://www.xray.cz/iucrv/vidp.asp?id=279
11:25am - 11:45am
Extracting interface correlations from the pair distribution function of composite materials 1Department of Chemistry, University of Oxford, South Parks Road, Oxford, OX1 3QR, U.K; 2ISIS Facility, Rutherford Appleton Laboratory, Harwell Science and Innovation Cam- pus, Didcot, OX11 0QX, U.K. External Resource: https://www.xray.cz/iucrv/vidp.asp?id=280
11:45am - 12:05pm
Total scattering at grazing incidence to study real thin film systems at variable temperature 1Deutsches Elektronen-Synchrotron DESY, Hamburg, Germany; 2Department of Chemistry, Aarhus University, 8000 Aarhus C, Denmark External Resource: https://www.xray.cz/iucrv/vidp.asp?id=281
12:05pm - 12:25pm
Magnetic pair distribution function analysis of antiferromagnetic semiconductor MnTe Brigham Young University, Provo, United States of America External Resource: https://www.xray.cz/iucrv/vidp.asp?id=282
12:25pm - 12:45pm
The local structure fingerprint of dual orbital degeneracy lifting in a strongly correlated electron system 1Condensed Matter Physics and Materials Science Division, Brookhaven National Laboratory, Upton, NY 11973, USA; 2Department of Physics and Astronomy, University of Tennessee, Knoxville, TN 37996, USA; 3Neutron Scattering Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA; 4Photon Sciences Division, Brookhaven National Laboratory, Upton, NY 11973, USA; 5Department of Applied Physics and Applied Mathematics, Columbia University, New York, NY 10027, USA External Resource: https://www.xray.cz/iucrv/vidp.asp?id=283
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