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Index of Titles

A complete list of all conference contributions. Use the alphabetical filter or the search box below to find specific submissions. Click on any contribution to view its session details.

List by Initial Letter: A B C D E F G H I J K L M N O P Q R S T U V W X Y Z ’ All Titles

Contribution Title	Author(s)	Session
Identification and Mitigation of Nonlinear Instrumental Bias in Fiber-Optic Coherent DIAL for Greenhouse Gas Sensing	Kikilich, Nikita (1); Akkala, Aarni (1); O'Connor, Ewan (2); Toivonen, Juha (1); Kalmankoski, Kim (1)	Applications of Optics and Photonics
Image Generation through Nonlinear Metasurfaces	Rahmani, Mohsen	Nonlinear Metasurfaces and Their Applications
Impact of a structured illumination methodology for 3D laser imaging through turbid media	Ngassa, Képhren (1); Cézard, Nicolas (1); Chami, Malik (2); COTTIN, Antoine (1); DARTIGALONGUE, Thibault (1)	Emerging Applications of Structured Light
Indirect optical geometry measurement of advanced surfaces via optical tweezers	Alidoust Chamandani, Saeed; Tausendfreund, Andreas; Fischer, Andreas	POSTER SESSION 2
Induced Modulational Instability in Gas-Filled Hollow-Core Fibers for Ultrashort Waveform Generation	Kallukkaran, Christeena Paul; Mussot, Arnaud; Kudlinski, Alexandre; Tani, Francesco	Ultrafast Phenomena: Pulse generation
Influence of vibrations, ambient light and surface texture on measurements of a drone-based laser triangulation system	Shareef, Ahraar; Freyberg, Axel von; Fischer, Andreas	Frontiers in Optical Metrology: Interferometry & phase metrology
Insights into surface passivation of InP by atomic-layer deposited POx/AlOx stacks	Massaro, Loredana Maria (1); Augustin, Luc (2,3); Macco, Bart (1)	Optical Materials: Optical thin films
Inspection and Defect Detection Using Digital Holography for Advanced Packaging	Mukundakumar, Balasubrahmaniyam; Barczyk, René; Matsuura, Shimpei	Frontiers in Optical Metrology: Semiconductor metrology
Integrated femtosecond laser-written Mach-Zehnder interferometer for refractive index sensing	Raju Kalathil, Loraien; Mouely Mouloungui, Idriss; Bellando, Louis; Doutre, Florent; Claudet, Cyrille; Forget, Nicolas; Labonte, Laurent; Bellec, Matthieu	Optical Materials: Light-matter interaction
Integrated mode-locked semiconductor laser with GHz repetition rate for triggering single photon sources	Quashef, Ajwaad (1); Tuorila, Heidi (1); Rajala, Patrik (1); Viheriälä, Jukka (2); Guina, Mircea (1)	Applications of Optics and Photonics
Integrated Photonics for Wavefront Shaping in Deep Tissue Imaging & Endoscopy	Milojković, Filip (1); Verellen, Niels (1); Peyskens, Frederic (1); Jansen, Roelof (1); Rottenberg, Xavier (1); Van Dorpe, Pol (1,2)	Phase Imaging and Manipulation
Interferometric control of phase singularity splitting	Govind, Diya (1); Laatikainen, Jyrki (2); Norrman, Andreas (1); Saastamoinen, Kimmo (1); Setälä, Tero (1); Halder, Atri (1)	POSTER SESSION 1
Interferometric traceability for mid- and large-range scanning probe microscopy	Korpelainen, Virpi; Sauvet, Bruno; Byman, Ville; Seppä, Jeremias; Lassila, Antti	POSTER SESSION 1
Invariant directional scattering effect	Bukharin, Mikhail (1); Basharin, Alexey (1); Evlyukhin, Andrey (2,3)	POSTER SESSION 1
Investigating grinding processes for optical components with application of machine learning models	Binder, Marcel; Berteit, Oliver; Henkel, Sebastian; Erfurth, Christian; Bliedtner, Jens	ODTM-1
Investigation of subsurface damage in ultrasonic-assisted grinding for face and lateral surface machining	Koch, Sarah (1); Henkel, Sebastian (1); Thelemann, Dennis (1); Frank, Samson (1); Goerg, Niclas (2); Ketelaer, Jens (2); Bliedtner, Jens (1)	POSTER SESSION 2
Investigation of the performance of Structured Illumination Microscopy for Two-Dimensional Metrology Using Numerical Simulations	Nouri, Mohammad (1,2); Kroker, Stefanie (1,2); Bodermann, Bernd (1)	Frontiers in Optical Metrology: Microscopy