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Session Overview | |
| Location: A.2.3b |
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| 11:45am - 1:15pm |
TOM2 S1: Holography and Radiometry Location: A.2.3b Chair: Andrea Mario Rossi, National Metrology Institute of Italy, Italy Invited TOM 2 Frontiers in Optical Metrology Invited - Recent advances in noise modeling and reduction in dual and multi-wavelength digital holographic metrology Le Mans University, France 12:15pm - 12:45pm Invited TOM 2 Frontiers in Optical Metrology Invited - In-flow tomographic imaging for single cells analysis 1: CNR-ISASI, Italy; 2: DICMaPI, Department of Chemical, Materials and Production Engineering, University of Naples “Federico II” 12:45pm - 1:15pm Invited TOM 2 Frontiers in Optical Metrology Invited - Development of silicon photodetectors for absolute optical power measurement INRIM, Italy |
| 2:15pm - 3:45pm |
TOM2 S2: Ellipsometry Location: A.2.3b Chair: Vittorio Cecconi, Loughborough University, United Kingdom Invited TOM 2 Frontiers in Optical Metrology Invited - Terahertz time-domain spectroscopic ellipsometry Technical University of Ostrava, Poland 2:45pm - 3:00pm TOM 2 Frontiers in Optical Metrology Imaging Mueller matrix ellipsometry measurements on measuring fields in the micrometre range Physikalisch-Technische Bundesanstalt (PTB), Bundesallee 100, 38116 Braunschweig, Germany 3:00pm - 3:15pm TOM 2 Frontiers in Optical Metrology Influence of line edge roughness in optical critical dimension metrology Friedrich Schiller University Jena, Germany 3:15pm - 3:30pm TOM 2 Frontiers in Optical Metrology Modeling of dimensions and sensing properties of gold gratings by spectroscopic ellipsometry and finite element method 1: Centre for Energy Research, Hungarian Research Network, Hungary; 2: Óbuda University, Hungary; 3: Zuse Institute Berlin, Germany; 4: JCMwave GmbH., Germany; 5: Friedrich Schiller University, Germany; 6: Physikalisch-Technische Bundesanstalt, Germany; 7: University of Debrecen, Hungary 3:30pm - 3:45pm TOM 2 Frontiers in Optical Metrology Comparison measurements for hybrid evaluation approaches in optical nanometrology 1: Physikalisch-Technische Bundesanstalt, Germany; 2: Friedrich-Schiller-Universität Jena; 3: VSL National Metrology Institute, Netherlands; 4: Dansk Fundamental Metrologi A/S, Denmark |
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| 8:45am - 10:15am |
TOM2 S3: Classical and Quantum Enhanced Interferometry Location: A.2.3b Chair: Andrea Mario Rossi, National Metrology Institute of Italy, Italy Invited TOM 2 Frontiers in Optical Metrology Invited - Non-linear interferometers – A convenient tool for (quantum) sensing with undetected light TU Darmstadt, Germany 9:15am - 9:30am TOM 2 Frontiers in Optical Metrology Coherence properties of light revealed from Hartmann mask data via quantum reconstruction algorithm 1: Palacky University, Czech Republic; 2: Universidad Complutense, Spain 9:30am - 9:45am TOM 2 Frontiers in Optical Metrology Investigation of the positioning accuracy of the Cat's Eye as a reference position in asphere-measuring interferometry Physikalisch-Technische Bundesanstalt (PTB), Bundesallee 100, 38116 Braunschweig, Germany 9:45am - 10:00am TOM 2 Frontiers in Optical Metrology Shack-Hartmann sensor: Sensitivity at the wavefront level revealed Palacky University, Czech Republic 10:00am - 10:15am TOM 2 Frontiers in Optical Metrology 2-D in-plane displacement measurement system at fast sampling rate of 5 kHz using sinusoidal phase modulation interferometer 1: Nagaoka University of Technology, Japan; 2: National Institute of Technology, Gunma College, Japan |
| 2:15pm - 3:45pm |
TOM2 S4: Modern Microscopic Nanometrology Location: A.2.3b Chair: Stefanie Kroker, TU Braunschweig, Germany Invited TOM 2 Frontiers in Optical Metrology Invited - Organisms-on-a-chip Polytechnic University of Milano, Italy 2:45pm - 3:00pm TOM 2 Frontiers in Optical Metrology Modeling microcylinder-assisted conventional, interference and confocal microscopy University of Kassel, Germany 3:00pm - 3:15pm TOM 2 Frontiers in Optical Metrology Microsphere-assistance in microscopic and confocal imaging University of Kassel, Germany 3:15pm - 3:30pm TOM 2 Frontiers in Optical Metrology Subsampling Schemes for compressive nearfield Spectroscopy Physikalisch-Technische Bundesanstalt, Germany 3:30pm - 3:45pm TOM 2 Frontiers in Optical Metrology Applications of Optical Vortices in Metrology Palacký University Olomouc, Czech Republic |
| 4:15pm - 5:45pm |
TOM2 S5: Advanced Optical (Nano-) Metrology Location: A.2.3b Chair: Peter Petrik, Centre for Energy Research, Hungary Invited TOM 2 Frontiers in Optical Metrology Invited - Near-interface sensing, imaging and nanometrology using smart surfaces. 1: Chemistry department, Bar-Ilan University, 529000, Ramat-Gan, Israel; 2: Institute of Nanotechnology and Advanced Materials (BINA), Bar-Ilan University, 529000, Ramat-Gan, Israel; 3: Université Paris Cité, SPPIN, Saints-Pères Paris Institute for the Neurosciences, CNRS, Paris, France 4:45pm - 5:00pm TOM 2 Frontiers in Optical Metrology Detection of refractive index and imperfection in thin film transparent polymer by back focal plane imaging 1: Chemistry department, Bar-Ilan University, 529000, Ramat-Gan, Israel; 2: Institute of Nanotechnology and Advanced Materials (BINA), Bar-Ilan University, 529000, Ramat-Gan, Israel; 3: Université Paris Cité, SPPIN Saints-Pères Paris Institute for the Neurosciences, CNRS, Paris, France 5:00pm - 5:30pm Invited TOM 2 Frontiers in Optical Metrology Invited - Measuring and compensating the optical transfer functions of flexible imaging waveguides for lensless endoscopy 1: TU Dresden, Germany; 2: Wroclaw University of Science and Technology 5:30pm - 5:45pm TOM 2 Frontiers in Optical Metrology Full Stokes polarimetry based on the polarization-holographic diffraction element of an optimal configuration Georgian Technical University, Georgia |
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| 8:45am - 10:15am |
ESR S1: Early Stage Researcher Session Location: A.2.3b Chair: Roman Vincent Calpe, University of Eastern Finland, Finland Chair: Valeria Nocerino, University of Naples Parthenope, Italy |