Conference Agenda

Invited - Recent advances in noise modeling and reduction in dual and multi-wavelength digital holographic metrology

Pascal Picart

Le Mans University, France

Invited - In-flow tomographic imaging for single cells analysis

Lisa Miccio¹, Daniele Pirone¹, Giusy Giugliano¹, Michela Schiavo¹, Fabrizio Licitra¹, Zhe Wang^1,2, Francesca Borrelli¹, Vittorio Bianco¹, Pasquale Memmolo¹, Pietro Ferraro¹

1: CNR-ISASI, Italy; 2: DICMaPI, Department of Chemical, Materials and Production Engineering, University of Naples “Federico II”

Invited - Development of silicon photodetectors for absolute optical power measurement

Giorgio Brida, Carlo Pepe, Mauro Rajteri

INRIM, Italy

Invited - Terahertz time-domain spectroscopic ellipsometry

Kamil Postava

Technical University of Ostrava, Poland

Imaging Mueller matrix ellipsometry measurements on measuring fields in the micrometre range

Jana Grundmann, Bernd Bodermann

Physikalisch-Technische Bundesanstalt (PTB), Bundesallee 100, 38116 Braunschweig, Germany

Influence of line edge roughness in optical critical dimension metrology

Thomas Siefke

Friedrich Schiller University Jena, Germany

Modeling of dimensions and sensing properties of gold gratings by spectroscopic ellipsometry and finite element method

Deshabrato Mukherjee^1,2, Sven Burger^3,4, Thomas Siefke⁵, Jeetendra Gour⁵, Bernd Bodermann⁶, Peter Petrik^1,7

1: Centre for Energy Research, Hungarian Research Network, Hungary; 2: Óbuda University, Hungary; 3: Zuse Institute Berlin, Germany; 4: JCMwave GmbH., Germany; 5: Friedrich Schiller University, Germany; 6: Physikalisch-Technische Bundesanstalt, Germany; 7: University of Debrecen, Hungary

Comparison measurements for hybrid evaluation approaches in optical nanometrology

Tim Käseberg¹, Bernd Bodermann¹, Matthias Sturm¹, Matthias Wurm¹, Thomas Siefke², Lauryna Siaudinyté³, Astrid Tranum Rømer⁴, Poul Erik Hansen⁴

1: Physikalisch-Technische Bundesanstalt, Germany; 2: Friedrich-Schiller-Universität Jena; 3: VSL National Metrology Institute, Netherlands; 4: Dansk Fundamental Metrologi A/S, Denmark

Invited - Non-linear interferometers – A convenient tool for (quantum) sensing with undetected light

Sergio Adrian Tovar Perez

TU Darmstadt, Germany

Coherence properties of light revealed from Hartmann mask data via quantum reconstruction algorithm

Marek Vítek¹, Michal Peterek¹, Dominik Koutný¹, Martin Paúr¹, Libor Moťka¹, Bohumil Stoklasa¹, Zdeněk Hradil¹, Jaroslav Řeháček¹, L.L. Sánchez-Soto²

1: Palacky University, Czech Republic; 2: Universidad Complutense, Spain

Investigation of the positioning accuracy of the Cat's Eye as a reference position in asphere-measuring interferometry

Gregor Scholz, Daniel Evers, Ines Fortmeier

Physikalisch-Technische Bundesanstalt (PTB), Bundesallee 100, 38116 Braunschweig, Germany

Shack-Hartmann sensor: Sensitivity at the wavefront level revealed

Michal Peterek, Libor Moťka, Bohumil Stoklasa, Jaroslav Řeháček, Zdeněk Hradil

Palacky University, Czech Republic

2-D in-plane displacement measurement system at fast sampling rate of 5 kHz using sinusoidal phase modulation interferometer

Masato Aketagawa¹, Masato Higuchi², Taku Sato¹

1: Nagaoka University of Technology, Japan; 2: National Institute of Technology, Gunma College, Japan

Invited - Organisms-on-a-chip

Manuela Teresa Raimondi

Polytechnic University of Milano, Italy

Modeling microcylinder-assisted conventional, interference and confocal microscopy

Tobias Pahl, Lucie Hüser, Tim Eckhardt, Sebastian Hagemeier, Felix Rosenthal, Michael Diehl, Peter Lehmann

University of Kassel, Germany

Microsphere-assistance in microscopic and confocal imaging

Lucie Hüser, Sebastian Hagemeier, Tobias Pahl, Peter Lehmann

University of Kassel, Germany

Subsampling Schemes for compressive nearfield Spectroscopy

Dario Siebenkotten, Manuel Marschall, Bernd Kästner

Physikalisch-Technische Bundesanstalt, Germany

Applications of Optical Vortices in Metrology

Petr Schovánek

Palacký University Olomouc, Czech Republic

Invited - Near-interface sensing, imaging and nanometrology using smart surfaces.

Adi Salomon^1,2,3, Martin Oheim³

1: Chemistry department, Bar-Ilan University, 529000, Ramat-Gan, Israel; 2: Institute of Nanotechnology and Advanced Materials (BINA), Bar-Ilan University, 529000, Ramat-Gan, Israel; 3: Université Paris Cité, SPPIN, Saints-Pères Paris Institute for the Neurosciences, CNRS, Paris, France

Detection of refractive index and imperfection in thin film transparent polymer by back focal plane imaging

Hodaya Klimovosky^1,2, Omer Shavit^2,3, Martin Oheim³, Adi Salomon^1,2,3

1: Chemistry department, Bar-Ilan University, 529000, Ramat-Gan, Israel; 2: Institute of Nanotechnology and Advanced Materials (BINA), Bar-Ilan University, 529000, Ramat-Gan, Israel; 3: Université Paris Cité, SPPIN Saints-Pères Paris Institute for the Neurosciences, CNRS, Paris, France

Invited - Measuring and compensating the optical transfer functions of flexible imaging waveguides for lensless endoscopy

Robert Kuschmierz¹, Jakob Dremel¹, Kinga Zolnacz^1,2, Tom Glosemeyer¹, Jürgen Czarske¹

1: TU Dresden, Germany; 2: Wroclaw University of Science and Technology

Full Stokes polarimetry based on the polarization-holographic diffraction element of an optimal configuration

Barbara Kilosanidze, George Kakauridze, Irakli Chaganava, Vladimir Dadivadze, Yuri Mshvenieradze

Georgian Technical University, Georgia