TOM 1 - Silicon Photonics and Guided-Wave Optics
TOM 2 - Computational, Adaptive and Freeform Optics
TOM 3 - Optical System Design, Tolerancing and Manufacturing
TOM 4 - Bio-Medical Optics
TOM 5 - Resonant Nanophotonics
TOM 6 - Optical Materials: crystals, thin films, organic molecules & polymers, syntheses, characterization and applications
TOM 7 - Thermal radiation and energy management
TOM 8 - Non-linear and Quantum Optics
TOM 9 - Opto-electronic Nanotechnologies and Complex Systems
TOM 10 - Frontiers in Optical Metrology
TOM 11 - Tapered optical fibers, from fundamental to applications
TOM 12 - Optofluidics
TOM 13 - Advances and Applications of Optics and Photonics
EU Project Session
Early Stage Researcher Session
Select a date or location to show only sessions at that day or location. Select a single session for a detailed view (with abstracts and downloads when you are logged in as a registered attendee). The rest of the TOM sessions, EU project session, tutorials, and Early Stage Researcher session will be updated soon. Thank you for your patience!
Please note that all times are shown in the time zone of the conference. The current conference time is: 26th Nov 2022, 08:10:22pm WET
4:00pm - 4:30pm Invited ID: 342 / TOM10 S04: 1 TOM 10 Frontiers in Optical Metrology
From quantum imaging to quantum reading and pattern recognition by quantum correlations
Ivano Ruo Berchera
The use of quantum states of light, such as entanglement and squeezing, allows surpassing the limitation of conventional measurement essentially increasing the amount information extracted about an object under investigation for a fixed probing energy. While quantum metrology deals with the estimation of an unknown value of a parameters encoded in a state or a physical transformation
(quantum channel), quantum hypothesis testing deals with the discrimination among discrete values characterized beforehand.
4:30pm - 4:45pm ID: 300 / TOM10 S04: 2 TOM 10 Frontiers in Optical Metrology
Reconstruction of coherence matrix in x-representation using nonclassical Hartmann sensor
Marek Vitek1, Michal Peterek1, Dominik Koutny1, Martin Paur1, Bohumil Stoklasa1, Libor Motka1, Zdenek Hradil1, Jaroslav Rehacek1, L.L. Sanchez-Soto2
1Palacky University, Czech Republic; 2Universidad Complutense Madrid
We show the coherence properties of a signal can be measured by a Hartmann wavefront sensor in a nonclassical regime. Recasting the detection theory of the classical Hartmann sensor in the sense of quantum tomography enables to measure the coherence function, which is an analogy to the density matrix of mixed quantum states. Two methods were tested for the reconstruction of the coherence matrix from the intensity scan in the nonclassical mode of the Hartmann sensor. The reconstruction was performed in a classic way using the POVM matrix and using data pattern tomography.
4:45pm - 5:00pm ID: 275 / TOM10 S04: 3 TOM 10 Frontiers in Optical Metrology
Stokes CMOS polarimetry limits studied at non-classical polarisation states
Eva Roiková, Štěpán Kunc
Technical University of Liberec, Czech Republic
We present the study of the two polarisation state analysers. The first consists of a polarisation camera with a removable QWP, and the second consists of a non-polarisation camera with a rotating QWP and a stationary linear polariser. The theoretical analysis and experiment focus on studying the influence of polarimeter optical components accuracy and errors such as retardation errors, misalignments and extinction ratio on Stokes parameters precision. This research is a cornerstone to understanding polarisation state analysers limits. We examined laser beams with non-classical polarisation distribution, namely the Poincaré beam and the beam with radial polarisation.
5:00pm - 5:15pm ID: 304 / TOM10 S04: 4 TOM 10 Frontiers in Optical Metrology
Fabrication influences on a miniaturised stokes polarimeter consisting of stacked nano-optical wire grid polarizer and retarders
Thomas Siefke, Markus Walther, Carsten Stock, Uwe Zeitner
FSU Jena, Germany
The polarization properties of light can be fully controlled with nano-optical wire grid polarizers and artificial birefringent grating structures. We demonstrate an integrated polarimeter based on stacked layers of such elements. However, the optical performance of such elements is fundamentally limited and may be further altered by deviations arising from the fabrication processes. In this contribution we investigate the influences on the polarimetry performance for such a device.