Conference Agenda

Topical Meetings and Sessions:

TOM 1 - Silicon Photonics and Guided-Wave Optics
TOM 2 - Computational, Adaptive and Freeform Optics
TOM 3 - Optical System Design, Tolerancing and Manufacturing
TOM 4 - Bio-Medical Optics
TOM 5 - Resonant Nanophotonics
TOM 6 - Optical Materials: crystals, thin films, organic molecules & polymers, syntheses, characterization and applications
TOM 7 - Thermal radiation and energy management
TOM 8 - Non-linear and Quantum Optics
TOM 9 - Opto-electronic Nanotechnologies and Complex Systems
TOM 10 - Frontiers in Optical Metrology
TOM 11 - Tapered optical fibers, from fundamental to applications
TOM 12 - Optofluidics
TOM 13 - Advances and Applications of Optics and Photonics
EU Project Session
Early Stage Researcher Session

More information on the Topical Meetings

Select a date or location to show only sessions at that day or location. Select a single session for a detailed view (with abstracts and downloads when you are logged in as a registered attendee). The rest of the TOM sessions, EU project session, tutorials, and Early Stage Researcher session will be updated soon. Thank you for your patience!

Please note that all times are shown in the time zone of the conference. The current conference time is: 2nd Dec 2022, 10:06:12am WET

Session Overview
TOM3 S06: Optical System Design, Tolerancing and Manufacturing
Wednesday, 14/Sept/2022:
4:30pm - 6:00pm

Session Chair: Jens Bliedtner, Ernst-Abbe-Uiversity of Applied Sciences Jena, Germany
Location: B032

Ground floor, 99 seats

Show help for 'Increase or decrease the abstract text size'
4:30pm - 5:00pm
ID: 351 / TOM3 S06: 1
TOM 3 Optical System Design, Tolerancing and Manufacturing

Development of an aluminium reflecting telescope for small satellite

Okiharu Kirino

Crystal Optics Inc., Japan

A finishing technique by direct polishing of aluminium was investigated for low-cost manufacturing of reflecting telescopes for small satellites, the number of which is expected to increase in the future. By MRF polishing of aluminium alloy manufactured by the rapid solidification method, it was possible to achieve an ultra-precise finish equivalent to that of glass, with a surface roughness of about 1 nm Sa and a form accuracy of 100 nm PV or less.

5:00pm - 5:15pm
ID: 285 / TOM3 S06: 2
TOM 3 Optical System Design, Tolerancing and Manufacturing

Light Scattering from Contamination and Defects – Measurement, Analysis, and Modelling

Tobias Herffurth1, Alexander Bergner1,2, Sven Schröder1, Marcus Trost1

1Fraunhofer IOF, Germany; 2Institute of Applied Physics, FSU Jena, Germany

Light scattering induced by contamination and defects on optical components can quickly limit the component’s performance. Therefore, imperfection analysis and budgeting are mandatory - but also challenging tasks. On the other hand, imperfections can be elegantly characterized using efficient, robust and non-contact light scattering techniques. This will be demonstrated in this contribution for area covering measurement approaches using laboratory instruments with highest sensitivity as well as elaborated sensor systems that are best suited for extended freeform surfaces. Moreover, the measurement results are used to derive practical imperfection scattering data and models that serve as input to model and predict the imperfection induced scattering on optical system level.

5:15pm - 5:45pm
ID: 350 / TOM3 S06: 3
TOM 3 Optical System Design, Tolerancing and Manufacturing

Automated detection of scratch and dig on optical surfaces

Jean-Michel Asfour

DIOPTIC GmbH, Germany

The optical industry in Germany is closely associated with names such as Ernst Leitz, Moritz Hensoldt and Oskar Barnack, all of whom started their success stories as craft businesses in Wetzlar about 150 years ago. Manufacturing was and still is dominated by craftsmanship, as is the associated quality inspection and metrology. An important step here is the inspection of optical surfaces for cosmetic defects, an activity that is still predominantly performed visually by hand today. We demonstrate the challenges that an automated solution must meet and present a machine inspection solution that fulfils the requirements of the ISO standard and is superior to a manual visual inspection in terms of measurement uncertainty and costs. The system allows integration into a modern manufacturing environment, with the possibility to collect statistics of defect classes and thus optimize manufacturing processes, as well as the connection of the measured data to production databases.

5:45pm - 6:00pm
ID: 336 / TOM3 S06: 4
TOM 3 Optical System Design, Tolerancing and Manufacturing

Investigations on the production of optical freeforms applying the advanced wheel polishing process

Sebastian Stoebenau1, Igor Morozov1, Rafael Hild1, Sebastian Henkel2, Christian Schulze2, Christoph Letsch2, Samson Frank2, Jens Bliedtner2

1OptoTech Optikmaschinen GmbH, Germany; 2Ernst-Abbe University of Applied Sciences Jena, Germany

The growing interest in providing additional degrees of freedom to the design of high-end optical systems has led to an increased demand for freeform optical elements. The efficient fabrication of such elements requires a polishing process that provides high removal rates and a stable removal function while working with a relatively small spot size. Taking these constraints into consideration this paper focusses on the successful implementation of polishing processes applying the A-WPT (Advanced Wheel Polishing Tool) technology. Addressing the requirements regarding its removal characteristics as mentioned before, it represents an appropriate choice for providing an efficient pre-polishing as well as corrective polishing technique. In order to maintain perpendicularity towards the freeform surface to be polished, the A-WPT is run on a 5-axis simultaneous machining system. First investigations of the achieved surface accuracy after pre-polishing were carried out as well as an assessment of residual surface features within different spatial frequency regions. In addition, the polished surface is being checked for remaining SSD using an OCT technique.