Conference Agenda

Topical Meetings and Sessions:

TOM 1 - Silicon Photonics and Guided-Wave Optics
TOM 2 - Computational, Adaptive and Freeform Optics
TOM 3 - Optical System Design, Tolerancing and Manufacturing
TOM 4 - Bio-Medical Optics
TOM 5 - Resonant Nanophotonics
TOM 6 - Optical Materials: crystals, thin films, organic molecules and polymers, syntheses, characterization and devices
TOM 7 - Thermal radiation and energy management
TOM 8 - Nonlinear and Quantum Optics
TOM 9 - Optics at Nanoscale (ONS)
TOM 10 - Optical Microsystems (OMS)
TOM 11 - Waves in Complex Photonic Media
TOM 12 - Optofluidics
TOM 13 - Ultrafast Optical Technologies and Applications
TOM 14 - Advances and Applications of Optics and Photonics
EU Project Session
Early Stage Researcher Session organised by SIOF
Grand Challenges of Photonics Session

More information on the Topical Meetings

Select a date or location to show only sessions at that day or location. Select a single session for detailed view (with abstracts and downloads when you are logged in as registered attendee). Plenary speeches, tutorials, and Early Researcher session will be updated very soon. Thank you for your patience!

Please note that all times are shown in the time zone of the conference. The current conference time is: 29th June 2022, 09:40:56 CEST

Session Overview
TOM3 S07: Optical System Design, Tolerancing and Manufacturing
Wednesday, 15/Sept/2021:
16:15 - 17:45

Session Chair: Bernhard Michel, Hembach Photonik GmbH, Germany
Location: Aula 9
1st Floor

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16:15 - 16:45
ID: 494 / TOM3 S07: 1
TOM 3 Optical System Design, Tolerancing and Manufacturing

State of the art and future IBF applications

David Schäfer

NTG Neue Technologien GmbH & Co.KG, Germany

For nearly 30 years NTG has been dealing with ion beam processing systems for the production of ultra-precise freely defined surfaces for optical components using ion beams. Machinable diameters of optics range from 0.5 mm – 2000 mm, enabling the market for micro-optical components as well as astronomical applications and EUV/X-Ray optics with highest demands on roughness and shape accuracy. We present state-of-the-art techniques and give an outlook to future industrial applications.

16:45 - 17:00
ID: 147 / TOM3 S07: 2
TOM 3 Optical System Design, Tolerancing and Manufacturing

Impact of pupil aberrations on wavefront manipulation

Thomas Nobis

Carl Zeiss AG, Germany

A systematic and quantitative analysis is given of the impact of pupil aberrations on the imaging performance in wavefront manipulation applications using adaptive optical elements. For the practical case of rotationally-symmetric types of wavefront corrections, such as defocus or spherical aberration, analytical expressions of the induced aberrations are derived including their pupil and field dependence. Each aberration is thereby related to the specific pupil aberration present at the adaptive element. The results can be used to specify the acceptable amount of pupil correction required for a specific magnitude and type of wavefront manipulation.

17:00 - 17:15
ID: 365 / TOM3 S07: 3
TOM 3 Optical System Design, Tolerancing and Manufacturing

Polishing force measurement by viscosity - the return of ketchup polishing

Max Schneckenburger1,2, Sven Höfler1,3, Oliver Fähnle4, Rainer Boerret1

1Aalen University, Germany; 2Technische Universität Ilmenau, Germany; 3Glasgow Caledonian University, Scotland; 4Eastern Switzerland University of Applied Sciences

If there is a change in force or a process variation of the polishing pressure the viscosity also changes. Conversely, the viscosity value could be used to determine the process variation of the polishing force. It is to be expected that the distance of the sensor to the polishing gap and the associated change in the viscosity value has a decisive influence on the accuracy of the measurement resolution. First polishing results will be presented and a bowl feed polishing like approach will be presented.

17:15 - 17:30
ID: 276 / TOM3 S07: 4
TOM 3 Optical System Design, Tolerancing and Manufacturing

SSD detection on LIDT tested coated fused silica samples

Heidi Cattaneo1, Daniel Schachtler2, Roelene Botha2, Oliver Fähnle1

1Eastern Switzerland University of Applied Sciences, Switzerland; 2RhySearch, Switzerland

Material changes and Sub-Surface Damage (SSD) under Laser-Induced Damage Threshold (LIDT) testing sites were investigated on coated fused silica samples. As a detection method, photothermal deflection technique utilizing a resonant UV laser beam was used. Local variations in UV absorption and probe beam transmittance due to previous exposure to strong laser pulses were strongly dependent on the coating itself and on the laser energy. Detected effects ranged from small surface dislocations to complete damage with material transformations.

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