JavaScript is Disabled
Your browser's JavaScript functionality is disabled. It has to be enabled to use this function of ConfTool.
Here you can find information on how to enable JavaScript
If you have any problems, please contact the organizers at info@adm2026.com.

Conference Agenda

Overview and details of the sessions of this conference. Please select a date or location to show only sessions at that day or location. Please select a single session for detailed view (with abstracts and downloads if available).

Daily Overview

Session

IMA+GD&T: Image Processing & Applications + Geometric Dimensioning, Tolerancing & Inspection
Location: B8.1.2
Session Chair: Prof. Ilaria Cristofolini, University of Trento
Session Chair: Prof. Rocco Furferi, UNIFI

Presentation 4

Dimensional Assessment of Pore Size in Binder-Jetted Lattice Structures Using Optical Methods

Marco ZAGO¹, Mattia MALTAURO^2,3, Giovanni POZZO⁴, Matteo PERINA⁴, Roberto MENEGHELLO⁵, Gianmaria CONCHERI², Ilaria CRISTOFOLINI¹

1: Department of Industrial Engineering, University di Trento, Italy; 2: Department of Civil, Environmental and Architectural Engineering, University of Padova; 3: Department of Industrial Engineering, University of Padova; 4: Mimest S.r.l; 5: Department of Management and Engineering, University of Padova

Lattice structures produced by additive manufacturing require reliable di-mensional verification, because their small features and internal porosity lim-it the use of conventional metrological instruments. This study evaluates an optical approach for estimating pore dimensions in stainless steel 316L lattice structures manufactured by binder jetting. Simple cubic lattices with a nomi-nal cell size of 500 µm and three strut thicknesses (150, 200, and 250 µm), corresponding to nominal pore sizes of 350, 300, and 250 µm, were ana-lyzed. Images were acquired on three mutually orthogonal planes using an Olympus DSX 1000 microscope and an OGP SmartScope 300 system. A us-er-defined MATLAB algorithm was developed to segment each pore, esti-mate its projected area, and calculate the corresponding pore size. The results were compared statistically to assess the influence of projection plane, nomi-nal pore size, and acquisition system. Both systems detected deviations from the nominal pore size, generally ranging from -20% to +5%, with higher ac-curacy on the YZ plane. The comparison indicates that optical acquisition combined with image analysis can support rapid and low-cost preliminary dimensional characterization of lattice structures, although further validation against a reference method, such as X-ray computed tomography, is re-quired.